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Shin-Etsu MicroSi, Inc. MEDIA CENTER
Altera selects Shin-Etsu 68KB Pathfinder Award 47KB CEM I-line 301KB
SPIE Triquin Paper 1MB CEM Paper 2.5MB Ultratech Paper 1.8MB
CEM Temperature and Shelf life Requirements 32KB SPIE 2005 Paper 328KB Adhesiveless Products
     
64KB

  Adhesiveless Press Release
         10KB
RoHS Press Release
       10KB
Novel Photosensitive Material  335KB  
  New Photoresist 16KB      
     
  Thick Copper Pillar Bump Fabrication article published in
Advanced Packaging Nov 2007
 
http://ap.pennnet.com/display_article/312377/36/ARTCL/none/none/1/Thick-Copper-Pillar-Bump-Fabrication/
 
     
  Where to Find Us - 2008 Trade Shows  
  Strategies in Light - Santa Clara - February 12 - 13, 2008 - Booth 400
SPIE - Microlithography - San Jose, Ca  - February  26 - 27, 2008  - Booth 707
MEPTEC - Thermal Management Issues - San Jose, Ca - February 28, 2008
SEMI-THERM - San Jose, Ca - March 16 - 20, 2008 
ECTC/ITHERM - Walt Disney World - May 28- 29, 2008
SEMICON West 2008 - San Francisco, Ca  - July 15 - 17, 2008 -
LED - San Diego, Ca - Sept. 29 - Oct. 1, 2008
 
     
  Where to Find Us - 2007 Trade Shows  
  Strategies in Light - San Jose - February 12 - 14, 2007
MEPTEC - Thermal Management Issues - San Jose, Ca - February 15, 2007
SPIE - Microlithography - San Jose, Ca  - February  26 - March 1, 2007
SEMI-THERM - San Jose, Ca - March 20 - 21, 2007 
ECTC/ITHERM - 57th Electronic Components - Reno, NV - May 29- June 1, 2007
SEMICON West 2007 - San Francisco, Ca  - July 16 - 20, 2007 - Booth 5165
LED - San Diego, Ca - October 24-26, 2007
 
     
  Where to Find Us - 2006 Trade Shows  
  Strategies in Light - San Francisco - February 15 - 17, 2006
MEPTEC - Thermal Management Issues - San Jose, Ca - February 16, 2006
SPIE - Microlithography - San Jose, Ca  - February  21 - 22, 2006 Booth 1113
SEMI-THERM - Dallas, Tx  - March 14 - 15, 2006  Booth 18
ECTC/ITHERM - 55th Electronic Components - San Diego, Ca - May 31 - June 1, 2006
SEMICON West 2006 - San Francisco, Ca  - July 11 - 13, 2006
SPIE - BACUS - Monterey, Ca. - September 19 - 20, 2006
 
     
  Shin-Etsu Introduces Novel Photoresists for Plating and Dielectric Films for Bump Processing and Thick Resist Applications  
  PHOENIX--(BUSINESS WIRE)--April 5, 2006--Shin-Etsu announced the development and release of two new photoresist materials for dielectric films and thick plating bump applications.                                                                                           New Photoresist 16KB  
     
  A Novel Photosensitive Material for Redistribution and Stress Buffer Reduction on 300mm Wafers  
  SINR demonstrates the mechanical and electrical properties need for both a stress buffer application and redistribution application.  Novel Photosensitive Material  335KB  
     
  Shin-Etsu MicroSi Announced their standard TIM II Thermal Interface Material Meets RoHS environmental requirements.  
  Shin-Etsu MicroSi, Inc. is pleased to announce that our standard TIM II thermal interface materials meet the requirements of the European Union’s Restriction of Hazardous Substances in Electrical and Electronic Equipment, RoHS Directive 2002/95/EC.  RoHS Press Release 10KB    MSDS Web Request - RoHS  
     
  Shin-Etsu MicroSi Announces New Line of Adhesiveless Flexible Copper Laminates                                        Adhesiveless Press Release  10KB  
  The “KN Series” products are a single sided copper construction while the “KV Series” is a double sided copper construction.  

Where to Find Us - 2005 Trade Shows

MEPTEC - Thermal Management Issues - San Jose, Ca - February 16, 2005
SPIE - Microlithography - San Jose, Ca  - March 1 - 2, 2005
SEMI-THERM - San Jose, Ca  - March 15 - 17, 2005
ECTC - 55th Electronic Components - Lake Buena Vista, FL- June 1-2, 2005
SEMICON West 2005 - San Francisco, Ca  - July 11 - 15, 2005
Characterization of 100 Micron Thick Positive
Photoresist on 300 mm Wafers

 SPIE 2005 Paper 328KB

This study developed a process for a single coat, positive tone, 100µm photoresist for bump processing on 300 mm wafers.
Altera selects Shin-Etsu Chemical’s thermal Interface Material
Altera selects Shin-Etsu 68KB

Altera Corporation has selected Shin-Etsu's thermally conductive interface gel material in the packaging of its high-end Stratix II FPGA family. Shin-Etsu's material exhibits excellent thermal characteristics, and its low modulus helps absorb stress between the integrated heat spreader in the package and pressure sensitive-low-k dielectric material in the silicon.
Shin-Etsu MicroSi awarded AMD’s prestigious Pathfinder Award
Pathfinder Award 47KB

Shin-Etsu MicroSi awarded AMD's prestigious Pathfinder Award AMD awarded its Pathfinder Award for Best Supplier to Shin-Etsu MicroSi and three other companies. Shin-Etsu MicroSi received the award for exceptional technology support and commitment for developing Thermal Interface Materials for microprocessors.
CEM Temperature and Shelf life Requirements
CEM Temperature and Shelf life Requirements 32KB

Shin-Etsu MicroSi completed temperature and shelf-life testing on our CEM product line. This extensive evaluation allowed us to double some of the CEM shelf-life dates.
Characterization of an Ultra-Thick Positive Photoresist for Electroplating Applications 
SPIE Triquin Paper 1MB

This study shows that Shin-Etsu SIPR 7120M photoresist has well balanced lithographic properties, allowing it to be coated and exposed at 100µm thick with a single coat process. SIPR7120M is a positive acting; acid catalyzed based material that can be easily processed.
Contrast Enhancement Materials for Thick Photoresist Applications
CEM Paper 2.5MB

This study examines the feasibility of processing moderate and high contrast positive photoresists at 40µm thickness with a top of CEM.  The use of CEM dramatically improves the lithographic performance for both Shin-Etsu 9740 and Clariant AZ P4620.
Characterization of a Novel Photoresist Redistribution Material for Advanced Packaging Applications 
Ultratech Paper 1.8MB

This study details the feasibility of processing SINR 3170M photoresist on an Ultratech Saturn Spectrum 3 stepper for a redistribution level.  SINR 3170M is a negative acting, acid catalyzed, siloxane based material that can be easily processed.
Contrast Enhancement Materials for Yield Improvement in Submicron I-line Lithography
CEM I-line 301KB

By implementing CEM 365iS with the existing resist process, we were able to improve the DOF by about 0.7µm with sufficient exposure latitude.