SINR 3570M

  • Based on SINR-3170 chemistry
    • Modified for bonding at room temperature
  • Good adhesion for bonding:
    • Chip-to-wafer
    • Wafer-to-wafer
    • Wafer-to-glass
  • 70%-siloxane content for minimal wafer bowing
  • Same 180°C/1 hour cure as for SINR-3170
  • Minimal resist outgassing after wafer bonding

Description

  • Based on SINR-3170 chemistry
    • Modified for bonding at room temperature
  • Good adhesion for bonding:
    • Chip-to-wafer
    • Wafer-to-wafer
    • Wafer-to-glass
  • 70%-siloxane content for minimal wafer bowing
  • Same 180°C/1 hour cure as for SINR-3170
  • Minimal resist outgassing after wafer bonding

Additional information

Siloxane Content (%)

70

Young's Modulus (GPa)

0.15

CTE (ppm/°C)

180

Wafer Warpage (μm)

1.2

Stress on Si (MPa)

0.2

Elongation (%)

40

Product Documents

Photo-Imageable Dielectric Materials for Packaging and Bonding

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